MADTHOR

Dynamic & Static Power Transistor Testing

The MADTHOR Power Transistor Measurement System revolutionizes the characterization of
power transistors, combining dynamic and static test capabilities into a single powerful unit.
MADTHOR meets the strigent requirements for reliably and accurately measuring wide bandgap
power devices (GaN and SiC), as well as IGBT and silicon MOSFETs.

Whether for R&D purposes, product benchmarking or development, (pre-)qualification or for
quality control, MADTHOR accelerates device characterization and provides well-structured data
and graph outputs for analysis and documentation purposes.

Measurement Functionality Overview