Measurement Systems
Since the early days we have been eager to solve the complete system-level puzzle - thereby looking across the boundaries of the on-chip world. In need of better understanding passive components and power devices, we invented unique machines to measure them in real-life circumstances. Initially these machines where meant for internal use to support our IC designs. Today they are sold as commercial equipment that has no equal to better understand inductors, capacitors and transistors in actual applications.
MADMIX
A decade ago we discovered that switched-mode power supply inductors and capacitors were missing the required models to accurately simulate SMPS circuits. As a key component in the power IC development, this deficit triggered our in-house development of the MADMIX equipment.
These patented systems allow measurement of AC losses in SMPS inductors under real-life, switched-mode stimuli. Today this equipment is commercially available, serving its critical role in many labs throughout the world.
High-Voltage MADMIX
Built on the expertise and know-how of the industry leading MADMIX system, the High-Voltage MADMIX measurement system addresses the ever growing high power market.
With voltage capabilities up to 1000Vptp, accelerated development of inductors and transformers for application areas such as EV traction drivers, solar inverters, AC-DC mains SMPS is now possible. Core breakdown effects can be characterized and mitigated early in the design phase.
MADCAP
Complementary to the measurement of inductors, real-life measurement of capacitor behavior under square wave current loading was so far non-existent on the market.
MinDCet discovered a method to accurately measure and model the capacitors used in SMPS circuitry- which led to the patented MADCAP system. This equipment is currently in use at capacitor manufactures and labs, unlocking new insights and pushing developments.
MADTHOR
To complete our line-up of power-stage measurement systems, we developed MADTHOR. This system can perform static and dynamic measurements on power transistors with voltages up to 1200V.
The MADTHOR combines double pulse testing and static transistor analyzer capabilities for characterization of GaN and SiC wide bandgap power transistors as well as IGBT and silicon MOSFET devices. The high flexibility in measurement parameters and streamlined outputs ensure an accelerated evaluation, whether in the R&D phase, in qualification or for quality checks.
